KEW6010B
• Continuity:20/200Ω 200mA Test Current
• Insulation: 500/1000V, 20/200MΩ 1mA Rated Test Current
• Loop Impedance:20/2000Ω 15mA Test Current at 2000Ω (No RCD Trip)
• RCD:10/30/100/300/500mA x1/2, x1, Fast Trip(40ms), DC, Auto Ramp
• Test of a large kind of RCD’s:Standard, Selective, AC and A(DC sensitive breakers)
• Uc(Contact Voltage): 100V
• Designed to IEC 61010-1, IEC 61557
• Data Memory:300 measured results
• The stored data can be transferred to PC via Optical Adaptor Model 8212-USB or 8212-RS232C.
Documents:
Key Features
| Continuity Testing | ||
|---|---|---|
| Measuring Range | 20/200Ω (Auto-Ranging) | |
| Open Circuit Voltage | > 6V | |
| Short Circuit Current | > 200mA | |
| Accuracy | ±(3%rdg + 3dgt) | |
| Insulation Resistance Testing | ||
| Measuring Range | 20/200MΩ (Auto-Ranging) | |
| Test Voltage | 500/1000V | |
| Open Circuit Voltage | +20% - 0% | |
| Rated Current | > 1mA | |
| Accuracy | ± (3%rdg + 3dgt) | |
| Loop Impedance Testing | ||
| Impedance Range | 20/2000Ω | |
| Rated Voltage | 230V + 10% - 15%(50Hz) | |
| Normal Test Current | 20Ω:25A/10ms 2000Ω:15mA/350ms max. | |
| Accuracy | ±(3%rdg + 8dgt) | |
| RCD Testing | ||
| Test Current (Test Current Duration) | x1/2, x1 | 10, 30, 100, 300, 500mA (2000ms) |
| Fast | 150mA (50ms) | |
| DC | 10, 30, 100, 300mA (2000ms), 500mA (200ms) | |
| Auto Ramp | Goes up by 10% from 20% to 110% of IΔn. 300ms×10 | |
| Rated Voltage | 230V + 10% - 15% 50Hz | |
| Accuracy | Test Current | x1/2: -8%-2% x1, FAST: +2%+8% DC: ±10% Auto Ramp: ±4% |
| Trip Time | ±(1%rdg + 3dgt) | |
| Uc Testing | ||
| Measuring Range | 100V | |
| Rated Voltage | 230V + 10% - 15% (50Hz) | |
| Test Current | 5mA at IΔn = 10mA 15mA at IΔn = 30/100mA 150mA at IΔn = 300/500mA | |
| Accuracy | +5% to +15%rdg±8dgt | |